Fourier Transform Infrared Spectrometer - List of Manufacturers, Suppliers, Companies and Products

Spectrum 3NIR/MIR/FIR FTIR

Supports triple range! The beam splitter is an XR-beam splitter, FTIR system with far-infrared grid.

The "Spectrum 3NIR/MIR/FIR FTIR" is a top-class performance FTIR system that supports triple ranges. The beam splitter (B/S) is an XR-beam splitter and far-infrared grid, allowing for the simultaneous installation of two types. The highest resolution is specified at 0.4 cm-1 (mid-infrared). In addition, we offer a lineup that includes the high-performance near-infrared analysis "Spectrum 3 NIR" and the fully functional "Spectrum 3 MIR/FIR FTIR" equipped with advanced far-infrared capabilities. 【Specifications】 ■ Light Source - Downward-Looking Light Source - Near-Infrared Tungsten Halogen Light Source ■ Beam Splitter (B/S) - XR-Beam Splitter - Far-Infrared Grid *For more details, please refer to the PDF materials or feel free to contact us.

Company：PerkinElmer Japan
Price：Other

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Analytical Equipment and Devices
Spectroscopic Analysis Equipment
Fourier Transform Infrared Spectrometer

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High-resolution Fourier-transform infrared spectrometer nano-FTIR

Infrared imaging and spectroscopic measurements are possible, achieving a spatial resolution of 10 nm.

The nano-FTIR【neaSCOPE】 manufactured by attocube systems is a Fourier-transform infrared spectrometer that performs spectral imaging and spectral measurements with a maximum resolution of 10nm. Using patented technology, it extracts only the infrared spectrum from scattered light, achieving a spatial resolution of 10nm. The excitation wavelengths range from visible to terahertz, supporting further exploration in material science. It is ideal for various fields that require higher spatial resolution, including scientific disciplines, semiconductor technology, polymer chemistry, and life sciences. 【Features】 ■ Patented background noise removal technology by attocube systems ■ Achieves imaging and spectral measurements with high spatial resolution of 10nm ■ Developed a dedicated AFM that enables high reproducibility and high-sensitivity detection ■ Allows measurement of bulk cross-sections with sample preparation suitable for AFM measurements ■ No need for sample thinning! For more details, please contact us.